Evluation of Strength of Plane Microcracked Structural Elements Via Electrical Resistance Scanning

The paper focuses on experimental verification of a new approach to evaluate strength of structural elements via electrical resistance scanning. The approach utilizes explicit cross-property connections. In the case of multiple parallel cracks, we reconstruct certain characteristics of the microstru...

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Bibliographische Detailangaben
Veröffentlicht in:International Journal of Fracture, Vol. 185, No. 1/2 (2014), p. 171-178
1. Verfasser: Armstrong, W.
Weitere beteiligte Personen: Sevostianov, Igor
Format: elektronischer Aufsatz
Sprache:English
ISSN:1573-2673
Umfang:Online-Ressource
DOI:10.1007/s10704-013-9893-5
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