Evluation of Strength of Plane Microcracked Structural Elements Via Electrical Resistance Scanning

The paper focuses on experimental verification of a new approach to evaluate strength of structural elements via electrical resistance scanning. The approach utilizes explicit cross-property connections. In the case of multiple parallel cracks, we reconstruct certain characteristics of the microstru...

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Bibliographic Details
Published in:International Journal of Fracture, Vol. 185, No. 1/2 (2014), p. 171-178
Main Author: Armstrong, W.
Other Involved Persons: Sevostianov, Igor
Format: electronic Article
Language:English
ISSN:1573-2673
Physical Description:Online-Ressource
DOI:10.1007/s10704-013-9893-5
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  • The paper focuses on experimental verification of a new approach to evaluate strength of structural elements via electrical resistance scanning. The approach utilizes explicit cross-property connections. In the case of multiple parallel cracks, we reconstruct certain characteristics of the microstructure from resistance measurements and evaluate the corresponding strength reduction. The results are compared to actual fracture tests of preconfigured specimens. Experimental strength measurements show strong correlation to the results predicted by the resistance scanning technique.