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Your message regarding the following title:
Title: Evluation of Strength of Plane Microcracked Structural Elements Via Electrical Resistance Scanning
Author: Armstrong, W.
Other Involved Persons: Sevostianov, Igor
Source: International Journal of Fracture, Vol. 185, No. 1/2 (2014), p. 171-178
ISSN: 1573-2673

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