Impact of thermal frequency drift on highest precision force microscopy using quartz-based force sensors at low temperatures

In frequency modulation atomic force microscopy (FM-AFM) the stability of the eigenfrequency of the force sensor is of key importance for highest precision force measurements. Here, we study the influence of temperature changes on the resonance frequency of force sensors made of quartz, in a tempera...

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Bibliographic Details
Published in:Beilstein journal of nanotechnology, Vol. 5 (2014), p. 407-12
Main Author: Pielmeier, Florian
Other Involved Persons: Meuer, Daniel ; Schmid, Daniel ; Strunk, Christoph ; Giessibl, Franz J
Format: electronic Article
Language:English
ISSN:2190-4286
Item Description:Date Completed 29.04.2014
Date Revised 13.11.2018
published: Electronic-eCollection
Citation Status PubMed-not-MEDLINE
Copyright: From MEDLINE®/PubMed®, a database of the U.S. National Library of Medicine
Physical Description:Online-Ressource
DOI:10.3762/bjnano.5.48
Subjects:
AFM
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