Nano-wear of the diamond AFM probing tip under scratching of silicon, studied by AFM

Abstract In order to improve such a widely used microtribological testing procedure as surface scratching by an AFM diamond tip, an experimental study has been carried out using single-crystalline silicon as the tested material. Wear of the AFM diamond tip under scratching was observed by a decrease...

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Bibliographic Details
Published in:Tribology letters, Vol. 2 (1996), p. 345-354
Other Involved Persons: Khurshudov, Andrei G. ; Kato, Koji ; Koide, Hiroyuki
Format: electronic Article
Language:English
ISSN:1573-2711
Item Description:Copyright: Copyright 1996 J.C. Baltzer AG, Science Publishers
Physical Description:Online-Ressource
Subjects:
AFM
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