Nano-wear of the diamond AFM probing tip under scratching of silicon, studied by AFM
Abstract In order to improve such a widely used microtribological testing procedure as surface scratching by an AFM diamond tip, an experimental study has been carried out using single-crystalline silicon as the tested material. Wear of the AFM diamond tip under scratching was observed by a decrease...
|Published in:||Tribology letters, Vol. 2 (1996), p. 345-354|
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|Item Description:||Copyright: Copyright 1996 J.C. Baltzer AG, Science Publishers|
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