Evaluation of advanced semiconductor materials by electron microscopy : [proceedings of a NATO Advanced Research Workshop on the Evaluation of Advanced Semiconductor Materials by Electron Microscopy, held September 12 - 17, 1988, in Bristol, United Kingdon]

Bibliographic Details
Other Involved Persons: Cherns, David (Editor) ; Advanced Research Workshop on the Evaluation of Advanced Semiconductor Materials by Electron Microscopy (Other)
Format: Book
Language:English
Published: New York [u.a.] : Plenum Press 1989
ISBN:0306433621
9780306433627
Series:NATO. NATO ASI series / B 203
Item Description:Literaturangaben
Physical Description:XI, 412 S Ill., graph. Darst
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Ilmenau University Library, Stack

Holdings details from Universit├Ątsbibliothek Ilmenau, Magazin
Shelf Mark: 91:91 A 2906
Availability: Available

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